HP 4291A 1MHz-1,8GHz RF IMPEDANCE/MATERIAL ANALYZER Basic accuracy ±0.8%Advanced calibration and error compensationFour component test fixtures (OUT size: 0.5 mm to 20 mm)Independent parameter ...

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HP 4291A 1MHz-1,8GHz RF IMPEDANCE/MATERIAL ANALYZER

Basic accuracy ±0.8%
Advanced calibration and error compensation
Four component test fixtures (OUT size: 0.5 mm to 20 mm)
Independent parameter selection in 2 channels
Direct read-out permittivity, permeability
Two material fixtures (operating temperature: -55° to +200° C)
Versatile analysis (temperature, cole-cole plot, relaxation time)
Sweep parameters (frequency, ac level, dc bias, temperature)

Key Features
• Direct material parameter read-out (permittivity, permeability)
• Material analysis functions (cole-cole plots, relaxation time analysis)
• Versatile evaluation using a variety of swept parameters (frequency,
signal level, temperature, etc.)

Test Fixtures
Select from four types of component test fixtures: HP 16191A, HP 16192A,
HP 16193A, and HP 16194A. These test fixtures directly connect to the test
station's APC-7 connector. Each fixture is designed for a different component
size range, from 0.5 mm to 20 mm, and can handle different types of
termination. These adjustable fixtures simplify device connection. For
temperature coefficient testing, the HP 16194A high-temperature component
test fixture can be used in a temperature oven from -55° to +200° C.
Together with the HP 4291A's built-in compensation software, the fixtures
ensure impedance accuracy and measurement repeatability. The
HP 16453A dielectric material test fixture and HP 16454A magnetic material
test fixture improve the accuracy and ease of use for permittivity or
permeability measurements. These material fixtures have wide operating
temperature of-55° to +200° C.
For measuring thin-film devices and semiconductors, the HP 4291A
easily interfaces to a wafer prober. An extension cable connects the
HP 4291A's test head to a probe station. For temperature and humidity
testing, the HP 4291A can control an external temperature humidity
chamber via HP-IB and display the measurement result vs. temperature
or humidity.

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