HP 16453A Specification

https://testequipment.center/Product_Documents/Agilent-16453A-Specifications-308E1.pdf

HP 16453A DIELECTRIC MATERIAL TEST FIXTURE

 The 16453A has been designed to operate specifically with the 4291A RF Impedance/Material Analyzer equipped with the Option 002 (which provides the permittivity measurement function for dielectric material).

 The 16453A is designed for accurate dielectric constant and loss tangent measurements on the E4991A/4291A/B.

It employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor.

The E4991A/4291A/B measures the capacitance created from the fixure, and option 002 firmware calculates the relative complex permittivity as described in the 16451B. Adjustment to insure parallel electrodes is required when using the 16451B. This adjustment is not required with the 16453A because the fixure has a flexible electrode that adjusts automatically to the material surface.

Frequency:
1 MHz to 1 GHz

Sample size (smooth sheets only):
thickness: 0.3 mm to 3 mm
diameter: ≥ 15 mm